Volume 7, Issue 1, February 2019, Page: 8-22
Important Improvements of Helium Mass Spectrometry Test for Sealability
Genglin Wang, Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China
Ningbo Li, Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Wenbin Li, Corporation Headquarter, Beijing Keytone Electronic Relay Corporation, Beijing, China
Fei Li, Production Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Weigang Wu, Design Center, Beijing Keytone Electronic Relay Corporation, Beijing, China
Yongmin Liu, Administration Office, Beijing Keytone Electronic Relay Corporation, Beijing, China
Received: Dec. 11, 2018;       Accepted: Jan. 15, 2019;       Published: Feb. 13, 2019
DOI: 10.11648/j.jeee.20190701.12      View  44      Downloads  59
Abstract
Helium mass spectrometry test is one of the most commonly used electronic component sealability tests. However, it has a few obvious problems. For components passed test, their reliable storage life time is very uneven. During the test, feasibility of removing absorbed helium is low. High missing detection rate reduces the reliability of the test. Combined relevant patents and papers, and on the basis of theoretical derivation, verified by experimental and case analysis, this paper proposed a series of improvements. They include improvement fine-leak test basic criterion, quantitative determination of the maximum detection-waiting time for fine-leak test, a combination test method by using argon as gross-leak test tracer gas and helium as fine-leak test tracer gas as the core improvement, methods of reducing and preventing detection missing in the gross-leak test and fine-leak test.
Keywords
Sealability of Electronic Components, Helium Mass Spectrometry Test, Fine-Leak Test Basic Criterion, Maximum Detection-Waiting Time, Gross/Fine-Leak Combination Test, Argon as Gross-Leak Test Tracer Gas, Detection Missing Prevention
To cite this article
Genglin Wang, Ningbo Li, Wenbin Li, Fei Li, Weigang Wu, Yongmin Liu, Important Improvements of Helium Mass Spectrometry Test for Sealability, Journal of Electrical and Electronic Engineering. Vol. 7, No. 1, 2019, pp. 8-22. doi: 10.11648/j.jeee.20190701.12
Copyright
Copyright © 2019 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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